Advanced Sample Preparation Techniques for Transmission Electron Microscopy

TEM materials characterization pursues research activities aiming at the atomic-scale characterization of advanced materials. Special emphasis is usually given to the investigation of interfaces and grain boundaries within and between metals, ceramics, and bio-materials, including associated electronic and magnetic structures. The quality of results obtained on the microscope depends critically on the quality of the sample. Knowing how to prepare high-quality TEM samples is therefore of utmost importance. It is the aim of this lecture to cover various aspects of advanced TEM preparation techniques.