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11-01-7982 Introduction to Scanning Electron Microscopy · TUPlan

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11-01-7982

Introduction to Scanning Electron Microscopy

FB11 Material- und Geowissenschaften · Offered in WiSe 2025/26

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Weekly sessions · WiSe 2025/26

No weekly sessions listed.

Parts

11-01-7982-kuCourse1 contact h/week

Language: Englisch
Taught by: Dr. Philipp Komissinskiy

Course content

Basics of scanning electron microscopy; Breakdown of scanning electron microscopes (SEM) Electron and x-ray detectors Analysis of topography with secondary electrons Back scattered electrons for materials contrast Characteristic x-rays for microanalysis Sample preparation for SEM studies Introduction to the SEM Philips XL30-FEG: access to the SEM is granted for the course participants

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