Scanning Transmission Electron Microscopy

Electron probes of atomic dimensions are nowadays available in modern scanning transmission electron microscopes and make possible the efficient realization of incoherent imaging. The incoherent image uses high-angle scattering which leads to strong atomic number (Z) contrast and gives rise to "Z-contrast imaging". In the quest for higher resolution to understand the atomic origins of materials properties incoherent imaging appears to hold substantial advantages. This lecture will cover the (a) physical principles of incoherent imaging, (b) the electron Ronchigram, (c) instrumentation and alignment, (d) spherical aberration correction, (e) simulation and interpretation of Z-contrast images and (f) applications for nanostructure characterization and materials sciences. References: Scanning Transmission Electron Microscopy: Imaging and Analysis. Stephen J. Pennycook, Peter D. Nellist, Springer Aberration-corrected Analytical Electron Microscopy (RMS - Royal Microscopical Society). Rik Brydson Transmission Electron Microscopy: A Textbook for Materials Science. David B. Williams & C. Barry Carter